Please use this identifier to cite or link to this item:
http://repository.unmul.ac.id/handle/123456789/13327| Title: | Attended Webinar Series III from HORIBA Indonesia |
| Other Titles: | From Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM), and Surface –Enhanced Raman Spectroscopy/Acattering (SERS) to Nano Raman Spectroscopy with Tip-Enhanced Raman Scattering (TERS) |
| Authors: | Pasaribu, Subur P. |
| Issue Date: | 30-Jul-2021 |
| URI: | http://repository.unmul.ac.id/handle/123456789/13327 |
| Appears in Collections: | S - Faculty of Mathematics and Natural Sciences |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Certificate Horiba-26-30 Juli 21.pdf | 191.18 kB | Adobe PDF | View/Open |
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